This project examines fabrication-stage cyber-physical threats in SiC/GaN devices critical to CNI sectors including HVDC grids, radar systems, and EV traction inverters. It proposes the SICRAF framework—a five-layer model (identification, classification via 5D taxonomy, IEC 60812 risk assessment, stress-forecasting, mitigation)—validated through five scenarios drawn from verified supply-chain incidents (2021-2025). Grounded in PRISMA literature review (n=82, 2018+), the work aligns with NIS2 and CRA regulations, enhancing semiconductor supply-chain integrity and operational resilience via qualitative FMEA analysis.